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Complete or fast reference trace collection for simulating multiprogrammed workloads: choose one

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Author: Scott F. Kaplan Amherst College, Amherst, MA
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· Proceeding
SIGMETRICS '04/Performance '04 Proceedings of the joint international conference on Measurement and modeling of computer systems
ACM New York, NY, USA ©2004
table of contents ISBN:1-58113-873-3 doi>10.1145/1005686.1005747
· Newsletter
ACM SIGMETRICS Performance Evaluation Review Homepage
Volume 32 Issue 1, June 2004
ACM New York, NY, USA
table of contents doi>10.1145/1012888.1005747
Complete or fast reference trace collection for simulating multiprogrammed workloads: choose one Published by ACM 2004 Article
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