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Leakage power reduction by dual-vth designs under probabilistic analysis of vth variation
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Authors:
Michael Liu
University of Texas at Austin, Austin, TX
Wei-Shen Wang
University of Texas at Austin, Austin, TX
Michael Orshansky
University of Texas at Austin, Austin, TX
Published in:
· Proceeding
ISLPED '04
Proceedings of the 2004 international symposium on Low power electronics and design
Pages 2 - 7
ACM
New York, NY
, USA
©2004
table of contents
ISBN:1-58113-929-2
doi>
10.1145/1013235.1013243
2004 Article
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· Citation Count: 10
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Tags:
experimentation
modeling techniques
power minimization
reliability
variability
yield
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