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Assessing Fault Sensitivity in MPI Applications
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Authors:
Charng-da Lu
University of Illinois at Urbana-Champaign
Daniel A. Reed
University of North Carolina
Published in:
· Proceeding
SC '04 Proceedings of the 2004 ACM/IEEE conference on Supercomputing
Page 37
IEEE Computer Society
Washington, DC
, USA
©2004
table of contents
ISBN:0-7695-2153-3
doi>
10.1109/SC.2004.12
2004 Article
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· Citation Count: 13
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