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An analysis of the robustness of CMOS delay elements
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Authors:
Srivathsan Krishnamohan
Michigan State University, East Lansing, MI
Nihar R. Mahapatra
Michigan State University, East Lansing, MI
Published in:
· Proceeding
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
ACM
New York, NY
, USA
©2005
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ISBN:1-59593-057-4
doi>
10.1145/1057661.1057759
2005 Article
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· Downloads (6 Weeks): 2
· Downloads (12 Months): 23
· Citation Count: 2
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Tags:
delay element
design
design aids
measurement
monte carlo simulation
process variation
yield
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