Fast and robust detection of crest lines on meshes

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Authors: Shin Yoshizawa MPI Informatik, Saarbrücken, Germany
Alexander Belyaev MPI Informatik, Saarbrücken, Germany
Hans-Peter Seidel MPI Informatik, Saarbrücken, Germany
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· Proceeding
SPM '05 Proceedings of the 2005 ACM symposium on Solid and physical modeling
Pages 227 - 232
ACM New York, NY, USA ©2005
table of contents ISBN:1-59593-015-9 doi>10.1145/1060244.1060270
Fast and robust detection of crest lines on meshes Published by ACM 2005 Article
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· Citation Count: 40


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