ACM DL

SIGN IN   SIGN UP

 
ACM Home Page ACM Digital Library Home Page

Static analysis tools as early indicators of pre-release defect density

Full Text: PdfPdf Buy this ArticleBuy this Article
Authors: Nachiappan Nagappan North Carolina State University, Raleigh, NC
Thomas Ball Microsoft Research, Redmond, WA
Published in:
· Proceeding
ICSE '05 Proceedings of the 27th international conference on Software engineering
ACM New York, NY, USA ©2005
table of contents ISBN:1-58113-963-2 doi>10.1145/1062455.1062558
Static analysis tools as early indicators of pre-release defect density Published by ACM 2005 Article
Bibliometrics Data  Bibliometrics
· Downloads (6 Weeks): 16
· Downloads (12 Months): 109
· Citation Count: 27


Tools and Resources

Share:

|
feedback Feedback | Switch to single page view (no tabs)

Powered by The ACM Guide to Computing Literature


The ACM Digital Library is published by the Association for Computing Machinery. Copyright © 2012 ACM, Inc.
Terms of Usage   Privacy Policy   Code of Ethics   Contact Us

Useful downloads: Adobe Acrobat    QuickTime    Windows Media Player    Real Player
The ACM Guide to Computing Literature
All Tags
Export Formats
 
 
Save to Binder