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Designing logic circuits for probabilistic computation in the presence of noise
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Authors:
K. Nepal
Brown University, Providence, RI
R. I. Bahar
Brown University, Providence, RI
J. Mundy
Brown University, Providence, RI
W. R. Patterson
Brown University, Providence, RI
A. Zaslavsky
Brown University, Providence, RI
2005 Article
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Published in:
· Proceeding
DAC '05
Proceedings of the 42nd annual Design Automation Conference
Pages 485-490
ACM
New York, NY
, USA
©2005
table of contents
ISBN:1-59593-058-2
doi>
10.1145/1065579.1065706
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Tags:
design
emerging technologies
markov random fields
nanodevices
noise immunity
probabilistic computing
reliability
reliability
reliability, testing, and fault-tolerance
subthreshold operation
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