Full-chip analysis of leakage power under process variations, including spatial correlations

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Authors: Hongliang Chang University of Minnesota
Sachin S. Sapatnekar University of Minnesota
Published in:
· Proceeding
DAC '05 Proceedings of the 42nd annual Design Automation Conference
Pages 523-528
ACM New York, NY, USA ©2005
table of contents ISBN:1-59593-058-2 doi>10.1145/1065579.1065716
Full-chip analysis of leakage power under process variations, including spatial correlations Published by ACM 2005 Article
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· Citation Count: 59


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