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An effective DFM strategy requires accurate process and IP pre-characterization
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Authors:
Carlo Guardiani
PDF Solutions, San Jose, CA
Massimo Bertoletti
PDF Solutions, San Jose, CA
Nicola Dragone
PDF Solutions, San Jose, CA
Marco Malcotti
PDF Solutions, San Jose, CA
Patrick McNamara
PDF Solutions, San Jose, CA
2005 Article
Bibliometrics
· Downloads (6 Weeks): 3
· Downloads (12 Months): 10
· Citation Count: 3
Published in:
· Proceeding
DAC '05
Proceedings of the 42nd annual Design Automation Conference
ACM
New York, NY
, USA
©2005
table of contents
ISBN:1-59593-058-2
doi>
10.1145/1065579.1065779
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algorithms
design
dfm
experimentation
modeling methodologies
reliability
test chips
yield
yield models
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