Failure detection and localization in component based systems by online tracking

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Authors: Haifeng Chen NEC Laboratories America, Inc., Princeton, NJ
Guofei Jiang NEC Laboratories America, Inc., Princeton, NJ
Cristian Ungureanu NEC Laboratories America, Inc., Princeton, NJ
Kenji Yoshihira NEC Laboratories America, Inc., Princeton, NJ
Failure detection and localization in component based systems by online tracking Published by ACM 2005 Article
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· Proceeding
KDD '05 Proceedings of the eleventh ACM SIGKDD international conference on Knowledge discovery in data mining
Pages 750-755
ACM New York, NY, USA ©2005
table of contents ISBN:1-59593-135-X doi>10.1145/1081870.1081968

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