Automated test plan generator for database application systems

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Authors: Mary Ann Robbert Dept. of Computer Information Systems, Morisin Hall, Bentley College, Waltham, Massachusetts
Fred J. Maryanski Dept. of Computer Science & Engineering, Box U-155, University of Connecticut, Storrs, Connecticut
Published in:
· Proceeding
SIGSMALL '91 Proceedings of the 1991 ACM SIGSMALL/PC symposium on Small systems
Pages 100 - 106
ACM New York, NY, USA ©1991
table of contents ISBN:0-89791-396-5 doi>10.1145/111048.111061
Automated test plan generator for database application systems Published by ACM 1991 Article
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