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Autonomous-repair cell for fault tolerant dynamic-reconfigurable devices
Authors:
Kentaro Nakahara
Kyoto University, Kyoto, Japan
Shin'ichi Kouyama
Kyoto University, Kyoto, Japan
Tomonori Izumi
Ritsumeikan University, Shiga, Japan
Hiroyuki Ochi
Kyoto University, Kyoto, Japan
Yukihiro Nakamura
Kyoto University, Kyoto, Japan
2006 Article
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Published in:
· Proceeding
FPGA '06
Proceedings of the 2006 ACM/SIGDA 14th international symposium on Field programmable gate arrays
Pages 224-224
ACM
New York, NY
, USA
©2006
table of contents
ISBN:1-59593-292-5
doi>
10.1145/1117201.1117237
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FPGA'14
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Tags:
reliability, testing, and fault-tolerance
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