SIGN IN
SIGN UP
Testing embedded RAM modules in SRAM-based FPGAs
Authors:
Mohammed Y. Niamat
University of Toledo, Toledo, OH
Dinesh Nemade
University of Toledo, Toledo, OH
Mohsin M. Jamali
University of Toledo, Toledo, OH
Published in:
· Proceeding
FPGA '06
Proceedings of the 2006 ACM/SIGDA 14th international symposium on Field programmable gate arrays
Pages 228-228
ACM
New York, NY
, USA
©2006
table of contents
ISBN:1-59593-292-5
doi>
10.1145/1117201.1117245
2006 Article
Bibliometrics
· Downloads (6 Weeks): n/a
· Downloads (12 Months): n/a
· Downloads (cumulative): n/a
· Citation Count: 0
Tools and Resources
Buy this Article in Print
Request Permissions
TOC Service:
Email
RSS
Save to Binder
Export Formats:
BibTeX
EndNote
ACM Ref
Upcoming Conference:
FPGA'14
Share:
|
Tags:
design
gate arrays
memory technologies
reliability, testing, and fault-tolerance
verification
Feedback
|
Switch to
single page view
(no tabs)
**Javascript is not enabled and is required for the "tabbed view" or switch to the
single page view
**
Powered by
The ACM Guide to Computing Literature
All Tags
Export Formats
Save to Binder