Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement of reconfigurable devices

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Authors: Kazuya Katsuki Kyoto University, Kyoto, Japan
Manabu Kotani Kyoto University, Kyoto, Japan
Kazutoshi Kobayashi Kyoto University, Kyoto, Japan
Hidetoshi Onodera Kyoto University, Kyoto, Japan
Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement of reconfigurable devices 2006 Article
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· Proceeding
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Pages 110 - 111
IEEE Press Piscataway, NJ, USA ©2006
table of contents ISBN:0-7803-9451-8 doi>10.1145/1118299.1118331

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