Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits

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Authors: Yoshinobu Higami Ehime University
Kewal K. Saluja University of Wisconsin-Madison
Hiroshi Takahashi Ehime University
Shin-ya Kobayashi Ehime University
Yuzo Takamatsu Ehime University
Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits 2006 Article
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· Proceeding
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Pages 659 - 664
IEEE Press Piscataway, NJ, USA ©2006
table of contents ISBN:0-7803-9451-8 doi>10.1145/1118299.1118455

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