A novel LCD driver testing technique using logic test channels

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Authors: Chauchin Su National Chiao Tung University, Hsinchu, Taiwan
Wei-Juo Wang National Central University, Chung-Li, Tauyuan, Taiwan
Chih-Hu Wang National Central University, Chung-Li, Tauyuan, Taiwan
IS Tseng Chroma ATE Inc., Wu-Ku, Taipei, Taiwan
A novel LCD driver testing technique using logic test channels Published by ACM 2003 Article
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· Proceeding
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Pages 657 - 662
ACM New York, NY, USA ©2003
table of contents ISBN:0-7803-7660-9 doi>10.1145/1119772.1119920

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