Evaluation of on-chip transmission line interconnect using wire length distribution

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Authors:	Junpei Inoue	Tokyo Institute of Technology, Midori-ku, Yokohama, Japan
	Hiroyuki Ito	Tokyo Institute of Technology, Midori-ku, Yokohama, Japan
	Shinichiro Gomi	Tokyo Institute of Technology, Midori-ku, Yokohama, Japan
	Takanori Kyogoku	Tokyo Institute of Technology, Midori-ku, Yokohama, Japan
	Takumi Uezono	Tokyo Institute of Technology, Midori-ku, Yokohama, Japan
	Kenichi Okada	Tokyo Institute of Technology, Midori-ku, Yokohama, Japan
	Kazuya Masu	Tokyo Institute of Technology, Midori-ku, Yokohama, Japan