Optimizing noise-immune nanoscale circuits using principles of Markov random fields

doi:10.1145/1127908.1127945

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Optimizing noise-immune nanoscale circuits using principles of Markov random fields

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Authors:	K. Nepal	Brown University, Providence, RI
	R. I. Bahar	Brown University, Providence, RI
	J. Mundy	Brown University, Providence, RI
	W. R. Patterson	Brown University, Providence, RI
	A. Zaslavsky	Brown University, Providence, RI

	2006 Article
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· Downloads (6 Weeks): 1 · Downloads (12 Months): 13 · Citation Count: 3

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	GLSVLSI '06 Proceedings of the 16th ACM Great Lakes symposium on VLSI
	ACM New York, NY, USA ©2006 table of contents ISBN:1-59593-347-6 doi>10.1145/1127908.1127945

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Tags: circuit optimization design emerging technologies error correcting codes markov random fields noise immunity reliability reliability, testing, and fault-tolerance subthreshold operation

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