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Authors:
A. El-Hoiydi
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
C. Arm
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
R. Caseiro
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
S. Cserveny
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
J.-D. Decotignie
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
C. Enz
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
F. Giroud
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
S. Gyger
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
E. Leroux
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
T. Melly
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
V. Peiris
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
F. Pengg
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
P.-D. Pfister
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
N. Raemy
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
A. Ribordy
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
D. Ruffieux
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
P. Volet
Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
2006 Article
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· Downloads (12 Months): 5
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Published in:
· Proceeding
DATE '06
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Pages 971-976
European Design and Automation Association
3001 Leuven, Belgium
, Belgium
©2006
table of contents
ISBN:3-9810801-0-6
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