ACM DL

SIGN IN   SIGN UP

 
ACM Home Page ACM Digital Library Home Page

Modelling the quality economics of defect-detection techniques

Full Text: PDFPDF Buy this ArticleBuy this Article
Author: Stefan Wagner Technische Universität München, München, Germany
Published in:
· Proceeding
WoSQ '06 Proceedings of the 2006 international workshop on Software quality
ACM New York, NY, USA ©2006
table of contents ISBN:1-59593-399-9 doi>10.1145/1137702.1137716
Modelling the quality economics of defect-detection techniques Published by ACM 2006 Article
Bibliometrics Data  Bibliometrics
· Downloads (6 Weeks): 1
· Downloads (12 Months): 30
· Citation Count: 2


Tools and Resources

Share:

|
feedback Feedback | Switch to single page view (no tabs)

Powered by The ACM Guide to Computing Literature


The ACM Digital Library is published by the Association for Computing Machinery. Copyright © 2012 ACM, Inc.
Terms of Usage   Privacy Policy   Code of Ethics   Contact Us

Useful downloads: Adobe Acrobat    QuickTime    Windows Media Player    Real Player
The ACM Guide to Computing Literature
All Tags
Export Formats
 
 
Save to Binder