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Entering the hot zone: can you handle the heat and be cool?
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Authors:
A. Yang
Apache Design Solutions
R. Chandra
Gradient Design Automation
S. Burke
ATI Technologies
J. A. DeLaCruz
eSilicon Corporation
S. Santhanam
P.A. Semi
U. Ko
Texas Instruments Inc.
2006 Article
Bibliometrics
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Published in:
· Proceeding
DAC '06
Proceedings of the 43rd annual Design Automation Conference
ACM
New York, NY
, USA
©2006
table of contents
ISBN:1-59593-381-6
doi>
10.1145/1146909.1146957
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DAC '12
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Tags:
design
design aids
design tools and techniques
ic packaging
low power
performance
reliability
reliability and testing
thermal effects
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