Hierarchical power distribution and power management scheme for a single chip mobile processor

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Authors: Toshihiro Hattori Renesas Technology Corp., Tokyo, Japan
Takahiro Irita Renesas Technology Corp., Tokyo, Japan
Masayuki Ito Renesas Technology Corp., Tokyo, Japan
Eiji Yamamoto Renesas Technology Corp., Tokyo, Japan
Hisashi Kato Renesas Technology Corp., Tokyo, Japan
Go Sado Renesas Technology Corp., Tokyo, Japan
Tetsuhiro Yamada Renesas Technology Corp., Tokyo, Japan
Kunihiko Nishiyama Renesas Technology Corp., Tokyo, Japan
Hiroshi Yagi Renesas Technology Corp., Tokyo, Japan
Takao Koike Renesas Technology Corp., Tokyo, Japan
Yoshihiko Tsuchihashi Renesas Technology Corp., Tokyo, Japan
Motoki Higashida Renesas Technology Corp., Tokyo, Japan
Hiroyuki Asano Renesas Technology Corp., Tokyo, Japan
Izumi Hayashibara Renesas Technology Corp., Tokyo, Japan
Ken Tatezawa Renesas Technology Corp., Tokyo, Japan
Yasuhisa Shimazaki Renesas Technology Corp., Tokyo, Japan
Naozumi Morino Renesas Technology Corp., Tokyo, Japan
Yoshihiko Yasu Renesas Technology Corp., Tokyo, Japan
Tadashi Hoshi Renesas Technology Corp., Tokyo, Japan
Yujiro Miyairi Renesas Technology Corp., Tokyo, Japan
Kazumasa Yanagisawa Renesas Technology Corp., Tokyo, Japan
Kenji Hirose Renesas Technology Corp., Tokyo, Japan
Saneaki Tamaki Renesas Technology Corp., Tokyo, Japan
Shinichi Yoshioka Renesas Technology Corp., Tokyo, Japan
Toshifumi Ishii Hitachi ULSI Systems, Fukuoka, Japan
Yusuke Kanno Hitachi, Ltd., Tokyo, Japan
Hiroyuki Mizuno Hitachi, Ltd., Tokyo, Japan
Tetsuya Yamada Hitachi, Ltd., Tokyo, Japan
Naohiko Irie Hitachi, Ltd., Tokyo, Japan
Reiko Tsuchihashi NTT DoCoMo, Inc., Knagawa, Japan
Nobuto Arai NTT DoCoMo, Inc., Knagawa, Japan
Tomohiro Akiyama NTT DoCoMo, Inc., Knagawa, Japan
Koji Ohno NTT DoCoMo, Inc., Knagawa, Japan
Hierarchical power distribution and power management scheme for a single chip mobile processor Published by ACM 2006 Article
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· Proceeding
DAC '06 Proceedings of the 43rd annual Design Automation Conference
Pages 292-295
ACM New York, NY, USA ©2006
table of contents ISBN:1-59593-381-6 doi>10.1145/1146909.1146986

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