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Modeling and minimization of PMOS NBTI effect for robust nanometer design
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Authors:
Rakesh Vattikonda
ASU, Tempe, AZ
Wenping Wang
ASU, Tempe, AZ
Yu Cao
ASU, Tempe, AZ
Published in:
· Proceeding
DAC '06
Proceedings of the 43rd annual Design Automation Conference
Pages 1047-1052
ACM
New York, NY
, USA
©2006
table of contents
ISBN:1-59593-381-6
doi>
10.1145/1146909.1147172
2006 Article
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· Downloads (12 Months): 518
· Downloads (cumulative): 1,432
· Citation Count: 60
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DAC '13
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Tags:
design
design aids
experimentation
nbti
performance
performance analysis and design aids
performance degradation
reliability
reliability
temperature
threshold voltage
variability
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