Outlier detection by active learning

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Authors: Naoki Abe IBM T. J. Watson Research Center, Yorktown Heights, NY
Bianca Zadrozny Universidade Federal Fluminense, Niterói, RJ, Brazil
John Langford Toyota Technological Institute at Chicago, Chicago, IL
Published in:
· Proceeding
KDD '06 Proceedings of the 12th ACM SIGKDD international conference on Knowledge discovery and data mining
Pages 504-509
ACM New York, NY, USA ©2006
table of contents ISBN:1-59593-339-5 doi>10.1145/1150402.1150459
Outlier detection by active learning Published by ACM 2006 Article
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· Citation Count: 19


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