Two-phase fine-grain sleep transistor insertion technique in leakage critical circuits

Full Text: PDFPDF Buy this ArticleBuy this Article
Authors: Yu Wang Tsinghua University, Beijing, P.R.China
Yongpan Liu Tsinghua University, Beijing, P.R.China
Rong Luo Tsinghua University, Beijing, P.R.China
Huazhong Yang Tsinghua University, Beijing, P.R.China
Hui Wang Tsinghua University, Beijing, P.R.China
Two-phase fine-grain sleep transistor insertion technique in leakage critical circuits Published by ACM 2006 Article
Bibliometrics Data  Bibliometrics
· Downloads (6 Weeks): 4
· Downloads (12 Months): 11
· Downloads (cumulative): 224
· Citation Count: 2

Published in:
Cover Image
 
· Proceeding
ISLPED '06 Proceedings of the 2006 international symposium on Low power electronics and design
Pages 238-243
ACM New York, NY, USA ©2006
table of contents ISBN:1-59593-462-6 doi>10.1145/1165573.1165631

Tools and Resources

Share:

|
feedback Feedback | Switch to single page view (no tabs)

Powered by The ACM Guide to Computing Literature


The ACM Digital Library is published by the Association for Computing Machinery. Copyright © 2013 ACM, Inc.
Terms of Usage   Privacy Policy   Code of Ethics   Contact Us

Useful downloads: Adobe Acrobat    QuickTime    Windows Media Player    Real Player
The ACM Guide to Computing Literature
All Tags
Export Formats
 
 
Save to Binder