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Automated analysis of feature models: challenges ahead
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Authors:
Don Batory
University of Texas at Austin
David Benavides
University of Seville, Spain
Antonio Ruiz-Cortes
University of Seville, Spain
Published in:
· Magazine
Communications of the ACM - Software product line
CACM Homepage
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Volume 49 Issue 12, December 2006
Pages 45-47
ACM
New York, NY
, USA
table of contents
doi>
10.1145/1183236.1183264
2006 Article
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· Downloads (12 Months): 65
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· Citation Count: 38
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software/program verification
system management
testing and debugging
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