Large scale drop impact analysis of mobile phone using ADVC on Blue Gene/L

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Authors: Hiroshi Akiba Allied Engineering Corporation, Japan
Tomonobu Ohyama Allied Engineering Corporation, Japan
Yoshinoir Shibata Allied Engineering Corporation, Japan
Kiyoshi Yuyama Allied Engineering Corporation, Japan
Yoshikazu Katai Allied Engineering Corporation, Japan
Ryuichi Takeuchi Allied Engineering Corporation, Japan
Takeshi Hoshino Allied Engineering Corporation, Japan
Shinobu Yoshimura University of Tokyo, Japan
Hirohisa Noguchi Keio University, Japan
Manish Gupta IBM Thomas J. Watson Research Center
John A Gunnels IBM Thomas J. Watson Research Center
Vernon Austel IBM Thomas J. Watson Research Center
Yogish Sabharwal IBM India Research Laboratory, India
Rahul Garg IBM India Research Laboratory, India
Shoji Kato Toshiba Corporation, Japan
Takashi Kawakami Toshiba Corporation, Japan
Satoru Todokoro NIWS Co., Ltd., Japan
Junko Ikeda NIWS Co., Ltd., Japan
Large scale drop impact analysis of mobile phone using ADVC on Blue Gene/L Published by ACM 2006 Article
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SC '06 Proceedings of the 2006 ACM/IEEE conference on Supercomputing
Article No. 46
ACM New York, NY, USA ©2006
table of contents ISBN:0-7695-2700-0 doi>10.1145/1188455.1188503

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