Robust and reliable defect control for Runge-Kutta methods

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Authors: W. H. Enright University of Toronto, Ont., Canada
Wayne B. Hayes University of California, Irvine, Irvine, CA
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ACM Transactions on Mathematical Software (TOMS) TOMS Homepage archive
Volume 33 Issue 1, March 2007
Article No. 1
ACM New York, NY, USA
table of contents doi>10.1145/1206040.1206041
Robust and reliable defect control for Runge-Kutta methods Published by ACM 2007 Article
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