RT level reliability enhancement by constructing dynamic TMRS

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Authors: Naghmeh Karimi University of Tehran, Tehran, Iran
Shahrzad Mirkhani University of Tehran, Tehran, Iran
Zainalabedin Navabi University of Tehran, Tehran, Iran
Fabrizio Lombardi Northeastern University, Boston, MA
RT level reliability enhancement by constructing dynamic TMRS Published by ACM 2007 Article
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GLSVLSI '07 Proceedings of the 17th ACM Great Lakes symposium on VLSI
Pages 172-175
ACM New York, NY, USA ©2007
table of contents ISBN: 978-1-59593-605-9 doi>10.1145/1228784.1228829

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