Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology

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Authors:	Riaz Naseer	University of Southern California, Los Angeles, CA
	Jeff Draper	University of Southern California, Los Angeles, CA
	Younes Boulghassoul	University of Southern California, Los Angeles, CA
	Sandeepan DasGupta	Vanderbilt University, Nashville, TN
	Art Witulski	Vanderbilt University, Nashville, TN

	2007 Article
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	· Proceeding
	GLSVLSI '07 Proceedings of the 17th ACM Great Lakes symposium on VLSI
	ACM New York, NY, USA ©2007 table of contents ISBN: 978-1-59593-605-9 doi>10.1145/1228784.1228843

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