SIGN IN
SIGN UP
Hardware-accelerated path-delay fault grading of functional test programs for processor-based systems
Full Text:
PDF
Buy this Article
Authors:
Paolo Bernardi
Politecnico di Torino, Torino, Italy
Michelangelo Grosso
Politecnico di Torino, Torino, Italy
Matteo Sonza Reorda
Politecnico di Torino, Torino, Italy
Published in:
· Proceeding
GLSVLSI '07
Proceedings of the 17th ACM Great Lakes symposium on VLSI
Pages 411-416
ACM
New York, NY
, USA
©2007
table of contents
ISBN: 978-1-59593-605-9
doi>
10.1145/1228784.1228881
2007 Article
Bibliometrics
· Downloads (6 Weeks): 3
· Downloads (12 Months): 26
· Downloads (cumulative): 197
· Citation Count: 1
Tools and Resources
Buy this Article
Request Permissions
TOC Service:
Email
RSS
Save to Binder
Export Formats:
BibTeX
EndNote
ACM Ref
Share:
|
Tags:
fault-emulation
fpga
path-delay
reliability
reliability, testing, and fault-tolerance
software-based testing
Feedback
|
Switch to
single page view
(no tabs)
**Javascript is not enabled and is required for the "tabbed view" or switch to the
single page view
**
Powered by
The ACM Guide to Computing Literature
All Tags
Export Formats
Save to Binder