Exploring linear structures of critical path delay faults to reduce test efforts

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Authors: Shun-Yen Lu National Tsing Hua University, Hsinchu, Taiwan
Pei-Ying Hsieh National Tsing Hua University, Hsinchu, Taiwan
Jing-Jia Liou National Tsing Hua University, Hsinchu, Taiwan
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· Proceeding
ICCAD '06 Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Pages 100-106
ACM New York, NY, USA ©2006
table of contents ISBN:1-59593-389-1 doi>10.1145/1233501.1233523
Exploring linear structures of critical path delay faults to reduce test efforts Published by ACM 2006 Article
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