Design and CAD challenges in 45nm CMOS and beyond

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Authors: David J. Frank IBM T. J. Watson Research Center, Yorktown Heights, NY
Ruchir Puri IBM T. J. Watson Research Center, Yorktown Heights, NY
Dorel Toma US Technology Development Center, Austin, TX
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· Proceeding
ICCAD '06 Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Pages 329-333
ACM New York, NY, USA ©2006
table of contents ISBN:1-59593-389-1 doi>10.1145/1233501.1233567
Design and CAD challenges in 45nm CMOS and beyond Published by ACM 2006 Article
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