Variability and yield improvement: rules, models, and characterization

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Authors: K. L. Shepard Columbia Univ., New York, NY
D. N. Maynard IBM Systems and Technology Group, Essex Junction, VT
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· Proceeding
ICCAD '06 Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Pages 834-835
ACM New York, NY, USA ©2006
table of contents ISBN:1-59593-389-1 doi>10.1145/1233501.1233677
Variability and yield improvement: rules, models, and characterization Published by ACM 2006 Article
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