MyExperience: a system for in situ tracing and capturing of user feedback on mobile phones

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Authors: Jon Froehlich University of Washington, Seattle, WA
Mike Y. Chen Ludic Labs, San Mateo, CA
Sunny Consolvo Intel Research, Seattle, WA
Beverly Harrison Intel Research, Seattle, WA
James A. Landay University of Washington, Seattle, WA
MyExperience: a system for <i>in situ</i> tracing and capturing of user feedback on mobile phones Published by ACM 2007 Article
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Published in:
· Proceeding
MobiSys '07 Proceedings of the 5th international conference on Mobile systems, applications and services
Pages 57-70
ACM New York, NY, USA ©2007
table of contents ISBN: 978-1-59593-614-1 doi>10.1145/1247660.1247670

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