Test quality analysis and improvement for an embedded asynchronous FIFO

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Authors: Tobias Dubois Linköpings Universitet, Embedded Systems Laboratory, Sweden
Erik Jan Marinissen NXP Semiconductors Research, The Netherlands
Mohamed Azimane NXP Semiconductors Research, The Netherlands
Paul Wielage NXP Semiconductors Research, The Netherlands and currently with NXP Semiconductors' IC Laboratory in Eindhoven, The Netherlands
Erik Larsson Linköpings Universitet, Embedded Systems Laboratory, Sweden
Clemens Wouters NXP Semiconductors, Digital Library Technology, The Netherlands
Test quality analysis and improvement for an embedded asynchronous FIFO 2007 Article
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DATE '07 Proceedings of the conference on Design, automation and test in Europe
Pages 859-864
EDA Consortium San Jose, CA, USA ©2007
table of contents ISBN: 978-3-9810801-2-4

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