Utilization of SECDED for soft error and variation-induced defect tolerance in caches

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Authors: Luong D. Hung The University of Tokyo, Hongo, Bunkyo, Tokyo, Japan
Hidetsugu Irie The University of Tokyo, Hongo, Bunkyo, Tokyo, Japan
Masahiro Goshima The University of Tokyo, Hongo, Bunkyo, Tokyo, Japan
Shuichi Sakai The University of Tokyo, Hongo, Bunkyo, Tokyo, Japan
Utilization of SECDED for soft error and variation-induced defect tolerance in caches 2007 Article
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DATE '07 Proceedings of the conference on Design, automation and test in Europe
Pages 1134-1139
EDA Consortium San Jose, CA, USA ©2007
table of contents ISBN: 978-3-9810801-2-4

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