Low-cost protection for SER upsets and silicon defects

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Authors: Mojtaba Mehrara University of Michigan, Ann Arbor, MI
Mona Attariyan University of Michigan, Ann Arbor, MI
Smitha Shyam University of Michigan, Ann Arbor, MI
Kypros Constantinides University of Michigan, Ann Arbor, MI
Valeria Bertacco University of Michigan, Ann Arbor, MI
Todd Austin University of Michigan, Ann Arbor, MI
Low-cost protection for SER upsets and silicon defects 2007 Article
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DATE '07 Proceedings of the conference on Design, automation and test in Europe
Pages 1146-1151
EDA Consortium San Jose, CA, USA ©2007
table of contents ISBN: 978-3-9810801-2-4

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