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A novel technique to use scratch-pad memory for stack management
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Authors:
Soyoung Park
Seoul National University, Seoul, Korea
Hae-woo Park
Seoul National University, Seoul, Korea
Soonhoi Ha
Seoul National University, Seoul, Korea
Published in:
· Proceeding
DATE '07
Proceedings of the conference on Design, automation and test in Europe
Pages 1478-1483
EDA Consortium
San Jose, CA
, USA
©2007
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ISBN: 978-3-9810801-2-4
2007 Article
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