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Linking TCAD to EDA—benefits and issues
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Authors:
G. Chin
Stanford University, Stanford, CA
W. Dietrich, Jr.
Stanford University, Stanford, CA
D. Boning
Texas Instruments, Dallas, TX
A. Wong
University of California at Berkeley, Berkeley, CA
A. Neureuther
University of California at Berkeley, Berkeley, CA
R. Dutton
Stanford University, Stanford, CA
1991 Article
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· Proceeding
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
ACM
New York, NY
, USA
©1991
table of contents
ISBN:0-89791-395-7
doi>
10.1145/127601.127735
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computer-aided design
computer-aided manufacturing
design
memory technologies
reliability
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