Assessing patent value through advanced text analysis

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Authors: Mohammad Al Hasan Rensselaer Polytechnic Institute, Troy, NY
W. Scott Spangler IBM Almaden Research Center, San Jose, CA
Published in:
· Proceeding
ICAIL '07 Proceedings of the 11th international conference on Artificial intelligence and law
Pages 191 - 192
ACM New York, NY, USA ©2007
table of contents ISBN: 978-1-59593-680-6 doi>10.1145/1276318.1276354
Assessing patent value through advanced text analysis Published by ACM 2007 Article
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· Downloads (cumulative): 270
· Citation Count: 0


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