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Device parts retrieval from assembly drawings with SVM based active relevance feedback
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Authors:
Rujie Liu
Fujitsu Research and Development Center, Beijing, China
Takayuki Baba
Fujitsu Laboratories, Kawasaki, Japan
Yusuke Uehara
Fujitsu Laboratories, Kawasaki, Japan
Daiki Masumoto
Fujitsu Laboratories, Kawasaki, Japan
Shigemi Nagata
Fujitsu Laboratories, Kawasaki, Japan
2007 Article
Bibliometrics
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· Downloads (12 Months): 10
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Published in:
· Proceeding
CIVR '07
Proceedings of the 6th ACM international conference on Image and video retrieval
ACM
New York, NY
, USA
©2007
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ISBN: 978-1-59593-733-9
doi>
10.1145/1282280.1282337
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Tags:
algorithms
assembly drawing
clustering
experimentation
information search and retrieval
measurement
relevance feedback
retrieval
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