ACM DL

SIGN IN   SIGN UP

 
ACM Home Page ACM Digital Library Home Page

Total ionizing dose effects in switched-capacitor filters using oscillation-based test

Full Text: PDFPDF Buy this ArticleBuy this Article
Authors: John M. Espinosa-Duran Universidad del Valle, Cali, Colombia
Jaime Velasco-Medina Universidad del Valle, Cali, Colombia
Gloria Huertas Institute of Microelectronic of Seville, Sevilla, Spain
Jose Luis Huertas Institute of Microelectronic of Seville, Sevilla, Spain
Total ionizing dose effects in switched-capacitor filters using oscillation-based test Published by ACM 2007 Article
Bibliometrics Data  Bibliometrics
· Downloads (6 Weeks): 1
· Downloads (12 Months): 5
· Citation Count: 0

Published in:
· Proceeding
SBCCI '07 Proceedings of the 20th annual conference on Integrated circuits and systems design
ACM New York, NY, USA ©2007
table of contents ISBN: 978-1-59593-816-9 doi>10.1145/1284480.1284551

Tools and Resources

Share:

|
feedback Feedback | Switch to single page view (no tabs)

Powered by The ACM Guide to Computing Literature


The ACM Digital Library is published by the Association for Computing Machinery. Copyright © 2012 ACM, Inc.
Terms of Usage   Privacy Policy   Code of Ethics   Contact Us

Useful downloads: Adobe Acrobat    QuickTime    Windows Media Player    Real Player
The ACM Guide to Computing Literature
All Tags
Export Formats
 
 
Save to Binder