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A software-based methodology for the generation of peripheral test sets based on high-level descriptions
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Authors:
Leticia M. V. Bolzani
Politecnico di Torino, Torino, Italy
Edgar E. Sanchez
Politecnico di Torino, Torino, Italy
Matteo Sonza Reorda
Politecnico di Torino, Torino, Italy
Published in:
· Proceeding
SBCCI '07
Proceedings of the 20th annual conference on Integrated circuits and systems design
Pages 348-353
ACM
New York, NY
, USA
©2007
table of contents
ISBN: 978-1-59593-816-9
doi>
10.1145/1284480.1284571
2007 Article
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SBCCI '13
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code coverage metrics
fault coverage
gate-level test metrics
reliability
reliability, testing, and fault-tolerance
rt-level test metrics
soc testing
test block
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