ACM DL

SIGN IN   SIGN UP

 
ACM Home Page ACM Digital Library Home Page

Using traceability to support model-based regression testing

Full Text: PDFPDF Buy this ArticleBuy this Article
Authors: Leila Naslavsky University of California, Irvine, Irvine, CA
Debra J. Richardson University of California, Irvine, Irvine, CA
Published in:
Cover Image
 
· Proceeding
ASE '07 Proceedings of the twenty-second IEEE/ACM international conference on Automated software engineering
ACM New York, NY, USA ©2007
table of contents ISBN: 978-1-59593-882-4 doi>10.1145/1321631.1321744
Using traceability to support model-based regression testing Published by ACM 2007 Article
Bibliometrics Data  Bibliometrics
· Downloads (6 Weeks): 10
· Downloads (12 Months): 65
· Citation Count: 2


Tools and Resources

Share:

|
feedback Feedback | Switch to single page view (no tabs)

Powered by The ACM Guide to Computing Literature


The ACM Digital Library is published by the Association for Computing Machinery. Copyright © 2012 ACM, Inc.
Terms of Usage   Privacy Policy   Code of Ethics   Contact Us

Useful downloads: Adobe Acrobat    QuickTime    Windows Media Player    Real Player
The ACM Guide to Computing Literature
All Tags
Export Formats
 
 
Save to Binder