Estimation of delay test quality and its application to test generation

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Authors: Seiji Kajihara Kyushu Institute of Technology, Iizuka, Japan
Shohei Morishima Kyushu Institute of Technology, Iizuka, Japan
Masahiro Yamamoto Kyushu Institute of Technology, Iizuka, Japan
Xiaoqing Wen Kyushu Institute of Technology, Iizuka, Japan
Masayasu Fukunaga STARC, Yokohama, Japan
Kazumi Hatayama STARC, Yokohama, Japan
Takashi Aikyo STARC, Yokohama, Japan
Estimation of delay test quality and its application to test generation 2007 Article
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· Proceeding
ICCAD '07 Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Pages 413-417
IEEE Press Piscataway, NJ, USA ©2007
table of contents ISBN:1-4244-1382-6

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