Speed and yield enhancement by track swapping on critical paths utilizing random variations for FPGAs

Authors: Yuuri Sugihara Kyoto University, Kyoto, Japan
Yohei Kume Kyoto University, Kyoto, Japan
Kazutoshi Kobayashi Kyoto University, Kyoto, Japan
Hidetoshi Onodera Kyoto University, Kyoto, Japan
Speed and yield enhancement by track swapping on critical paths utilizing random variations for FPGAs Published by ACM 2008 Article
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FPGA '08 Proceedings of the 16th international ACM/SIGDA symposium on Field programmable gate arrays
Pages 257-257
ACM New York, NY, USA ©2008
table of contents ISBN: 978-1-59593-934-0 doi>10.1145/1344671.1344711

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