Learning from mistakes: a comprehensive study on real world concurrency bug characteristics

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Authors: Shan Lu University of Illinois at Urbana Champaign, Urbana, IL
Soyeon Park University of Illinois at Urbana Champaign, Urbana, IL
Eunsoo Seo University of Illinois at Urbana Champaign, Urbana, IL
Yuanyuan Zhou University of Illinois at Urbana Champaign, Urbana, IL
Learning from mistakes: a comprehensive study on real world concurrency bug characteristics Published by ACM 2008 Article
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· Proceeding
ASPLOS XIII Proceedings of the 13th international conference on Architectural support for programming languages and operating systems
Pages 329-339
ACM New York, NY, USA ©2008
table of contents ISBN: 978-1-59593-958-6 doi>10.1145/1346281.1346323
· Newsletter
ACM SIGARCH Computer Architecture News - ASPLOS '08
Volume 36 Issue 1, March 2008
Pages 329-339
ACM New York, NY, USA
table of contents doi>10.1145/1353534.1346323
· Newsletter
ACM SIGOPS Operating Systems Review - ASPLOS '08
Volume 42 Issue 2, March 2008
Pages 329-339
ACM New York, NY, USA
table of contents doi>10.1145/1353535.1346323
· Newsletter
ACM SIGPLAN Notices - ASPLOS '08
Volume 43 Issue 3, March 2008
Pages 329-339
ACM New York, NY, USA
table of contents doi>10.1145/1353536.1346323

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