Automatic test data generation using particle systems

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Authors: Paulo M. S. Bueno Renato Archer Research Center, Campinas, São Paulo, Brazil
W. Eric Wong University of Texas at Dallas, Richardson, TX
Mario Jino State University of Campinas, Campinas, São Paulo, Brazil
Published in:
· Proceeding
SAC '08 Proceedings of the 2008 ACM symposium on Applied computing
Pages 809-814
ACM New York, NY, USA ©2008
table of contents ISBN: 978-1-59593-753-7 doi>10.1145/1363686.1363871
Automatic test data generation using particle systems Published by ACM 2008 Article
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· Downloads (cumulative): 254
· Citation Count: 1


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