The effect of program and model structure on mc/dc test adequacy coverage

Full Text: PDFPDF Buy this ArticleBuy this Article
Authors: Ajitha Rajan University of Minnesota, Minneapolis, MN, USA
Michael W. Whalen Rockwell Collins Inc. , Cedar Rapids, IA, USA
Mats P.E. Heimdahl University of Minnesota, Minneapolis, MN, USA
Published in:
Cover Image
 
· Proceeding
ICSE '08 Proceedings of the 30th international conference on Software engineering
Pages 161-170
ACM New York, NY, USA ©2008
table of contents ISBN: 978-1-60558-079-1 doi>10.1145/1368088.1368111
The effect of program and model structure on mc/dc test adequacy coverage Published by ACM 2008 Article
Bibliometrics Data  Bibliometrics
· Downloads (6 Weeks): 4
· Downloads (12 Months): 33
· Downloads (cumulative): 580
· Citation Count: 12


Tools and Resources

Share:

|
feedback Feedback | Switch to single page view (no tabs)

Powered by The ACM Guide to Computing Literature


The ACM Digital Library is published by the Association for Computing Machinery. Copyright © 2013 ACM, Inc.
Terms of Usage   Privacy Policy   Code of Ethics   Contact Us

Useful downloads: Adobe Acrobat    QuickTime    Windows Media Player    Real Player
The ACM Guide to Computing Literature
All Tags
Export Formats
 
 
Save to Binder